Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation
by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi
- First published 2024
- 366 pages
- English
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Details & editions
- This edition
- Springer International Publishing, 2024
- ISBN
- 9783031442322
- Language
- English
