Cover of Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation
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Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation

by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi

Language
English
Published
2025
Publisher
Springer International Publishing
Pages
366
ISBN
9783031442353
Genres
Nonfiction › Technology › EngineeringNonfiction › Science & mathematics › ChemistryNonfiction › Science & mathematics › PhysicsNonfiction › Science & mathematics › Biology

Original edition

Originally published in 2024 English Springer International Publishing

Other editions (1)